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Author Title Year (down) Publication Volume Times cited Additional Links
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles