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Year
Publication
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Frangis, N.
;
van Landuyt, J.
;
Grimaldi, M.G.
;
Calcagno, L.
Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He
+
1996
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – Symposium 1 on New Trends in Ion Beam Processing of Materials, at the, E-MRS 96 Spring Meeting, June 04-07, 1996, Strasbourg, France
120
2
UA library record
;
WoS full record
;
WoS citing articles
