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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Lebedev, O.I.; Bals, S.; Van Tendeloo, G.; Snoeck, G.E.; Retoux, R.; Boudin, S.; Hervieu, M. Mixed (Sr1-xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques 2006 International journal of materials research 97 1 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Van Aert, S.; Croitoru, M. Atomic resolution electron tomography: a dream? 2006 International journal of materials research 97 6 UA library record; WoS full record; WoS citing articles pdf doi
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