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Van Aert, S.
;
den Dekker, A.J.
;
van den Bos, A.
;
Van Dyck, D.
High resolution electron microscopy from imaging towards measuring
2001
... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3
UA library record
