Home << 1 >>
List View
 | 
Citations
 | 
Details
   web
Author Title Year (down) Publication Volume Times cited Additional Links
Ghica, C.; Nistor, L.C.; Bender, H.; Richard, O.; Van Tendeloo, G.; Ulyashin, A. TEM characterization of extended defects induced in Si wafers by H-plasma treatment 2007 Journal of physics: D: applied physics 40 10 UA library record; WoS full record; WoS citing articles
Ghica, C.; Nistor, L.C.; Bender, H.; Richard, O.; Van Tendeloo, G.; Ulyashin, A.; Characterization of {111} planar defects induced in silicon by hydrogen plasma treatments 2006 Philosophical magazine 86 12 UA library record; WoS full record; WoS citing articles