| Simionovici, A.S.; Chukalina, M.; Schroer, C.; Drakopoulos, M.; Snigirev, A.; Snigireva, I.; Lengeler, B.; Janssens, K.; Adams, F. |
High-resolution X-ray fluorescence microtomography of homogeneous samples |
2000 |
IEEE transactions on nuclear science |
47 |
|
UA library record; WoS full record; WoS citing articles |
