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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Markowicz, A.A.; Van Grieken, R.E. Quantification in XRF analysis of intermediate-thickness samples 2002 UA library record
Van Grieken, R.E.; Markowicz, A.A. Handbook of X-ray spectrometry 2002 UA library record
Markowicz, A.M.; Van Grieken, R.E. Quantification in XRF analysis of intermediate-thickness samples 1992 UA library record
Van Grieken, R.; Markowicz, A.; Veny, P. Current trends in the literature on X-ray emission spectrometry 1991 X-ray spectrometry 20 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Van Grieken, R.E. X-ray spectrometry 1990 Analytical chemistry 62 UA library record doi
Markowicz, A.A.; Van Grieken, R.E. X-ray spectrometry 1988 Analytical chemistry 60 UA library record doi
Markowicz, A.; Storms, H.; Van Grieken, R. A simple absorption correction for electron probe X-ray microanalysis of bulk samples 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.; Storms, H.; Van Grieken, R. Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Van Grieken, R.E. X-ray spectrometry 1986 Analytical chemistry 58 UA library record doi
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. Absorption correction in electron probe x-ray microanalysis of thin samples 1986 Analytical chemistry 58 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.; Markowicz, A.; Török, S. Energy-dispersive X-ray spectrometry : present state and trends 1986 Fresenius' Zeitschrift für analytische Chemie 324 UA library record doi
Markowicz, A.; Raeymaekers, B.; Van Grieken, R.; Adams, F. Analytical electron microscopy of single particles 1986 UA library record
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Influence of sample thickness, excitation energy and geometry on particle size effects in XRF 1985 X-ray spectrometry 14 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films 1985 Analytical chemistry 57 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Van Grieken, R.E. Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis 1984 Analytical chemistry 56 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Van Grieken, R.E. Atomic number correction in electron probe X-ray microanalysis of curved samples and particles 1984 Analytical chemistry 56 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Van Grieken, R.E. X-ray spectrometry 1984 Reviews in analytical chemistry 56 UA library record
Markowicz, A.; Van Dyck, P.; Van Grieken, R. Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis 1980 X-ray spectrometry 9 UA library record; WoS full record; WoS citing articles doi
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal 1980 X-ray spectrometry 9 UA library record; WoS full record; WoS citing articles doi
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