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Author
Title
Year
Publication
Volume
Times cited
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Van Aert, S.
;
Chang, L.Y.
;
Bals, S.
;
Kirkland, A.I.
;
Van Tendeloo, G.
Effect of amorphous layers on the interpretation of restored exit waves
2009
Ultramicroscopy
109
10
UA library record
;
WoS full record
;
WoS citing articles
Van Aert, S.
;
Bals, S.
;
Chang, L.Y.
;
den Dekker, A.J.
;
Kirkland, A.I.
;
Van Dyck, D.
;
Van Tendeloo, G.
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data
2008
UA library record
