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Author
Title
Year
Publication
Volume
Times cited
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Jehanathan, N.
;
Lebedev, O.
;
Gélard, I.
;
Dubourdieu, C.
;
Van Tendeloo, G.
Structure and defect characterization of multiferroic <tex>ReMnO$
3
films and multilayers by TEM
2010
Nanotechnology
21
15
UA library record
;
WoS full record
;
WoS citing articles
