| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. |
An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy |
2008 |
Ultramicroscopy |
108 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G. |
Model-based quantification of EELS spectra: treating the effect of correlated noise |
2008 |
Ultramicroscopy |
108 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. |
Optimal aperture sizes and positions for EMCD experiments |
2008 |
Ultramicroscopy |
108 |
27 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Godoi, R.H.M.; Potgieter-Vermaak, S.; Godoi, A.F.L.; Stranger, M.; Van Grieken, R. |
Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium |
2008 |
X-ray spectrometry |
37 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Grieken, R. |
Editorial: Award for best XRS referee during 2007-2008 |
2008 |
X-ray spectrometry |
37 |
|
UA library record; WoS full record |
|
