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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Blom, F.; Verbeeck, J.; Koster, G.; Houwman, E.P.; Rijnders, G. Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors 2021 Apl Materials 9 5 UA library record; WoS full record; WoS citing articles url doi
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