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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy 2019 Physical review letters 122 3 UA library record; WoS full record; WoS citing articles pdf url doi
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