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Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. Exploring possibilities of band gap measurement with off-axis EELS in TEM 2018 Ultramicroscopy 189 7 UA library record; WoS full record; WoS citing articles pdf url doi
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