| Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
| Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. |
Atomic resolution electron tomography |
2016 |
MRS bulletin |
41 |
19 |
UA library record; WoS full record; WoS citing articles |
| Evans, J.E.; Friedrich, H.; |
Advanced tomography techniques for inorganic, organic, and biological materials |
2016 |
MRS bulletin |
41 |
12 |
UA library record; WoS full record; WoS citing articles |
| Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
1994 |
MRS bulletin |
|
|
UA library record; WoS full record; |
