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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Muto, S.; Merk, N.; Schryvers, D.; Tanner, L.E. Displacive and diffusive components in the formation of the Ni2Al structure studied by HREM, SAED and micro-ED 1992 Monterey Institute for Advances Studies UA library record
Mitchell, T.E.; Gronsky, R.; Van Tendeloo, G. Oxide superconductors: electron microscopy 1992 UA library record
Milat, O.; Van Tendeloo, G.; Amelinckx, S.; Babu, T.G.N.; Greaves, C. The modulated structure of Ca.85CuO2 as studied by means of electron diffraction 1992 Journal of solid state chemistry 97 15 UA library record; WoS full record; WoS citing articles
Krekels, T.; Zou, H.; Van Tendeloo, G.; Wagner, D.; Buchgeister, M.; Hosseini, S.M.; Herzog, P. Ortho II structure in ABa2Cu307-d compounds (A=Er, Nd, Pr, Sm, Yb), pp 1992 Physica: C : superconductivity 196 52 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. A temperature study of mixed AgBr-AgBrI tabular crystals 1992 UA library record
Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. In situ HREM study of electron irradiation effects in AgCl microcrystals 1992 UA library record
Amelinckx, S.; Milat, O.; Van Tendeloo, G. The selective imaging of “substructures” in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41 1992 UA library record
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. Defects in high-dose oxygen implanted silicon : a TEM study 1991 Vacuum: the international journal and abstracting service for vacuum science and technology T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND 42 4 UA library record; WoS full record; WoS citing articles pdf doi
van Landuyt, J. The evolution of HVEM application in antwerp 1991 Ultramicroscopy T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan 39 UA library record; WoS full record doi
Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. The study of high Tc-superconducting materials by electron microscopy and electron diffraction 1991 Superconductor science and technology T2 – SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND 4 2 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Schryvers, D.; Tanner, L.E.; Broddin, D.; Ricolleau, C.; Loiseau, A. Structural phase transformations in alloys: an electron microscopy study 1991 Symposium on Pahse Transformations UA library record
Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. Electron microscopy of interfaces in new materials 1991 UA library record
Shapiro, S.M.; Yang, B.X.; Noda, Y.; Tanner, L.E.; Schryvers, D. Neutron-scattering and electron microscopy studies of premartensitic phenomena in NixAl100-x alloys 1991 Physical review : B : condensed matter and materials physics 44 123 UA library record; WoS full record; WoS citing articles
Schryvers, D.; de Saegher, B.; van Landuyt, J. Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al 1991 Materials research bulletin 26 11 UA library record; WoS full record; WoS citing articles
Schryvers, D. Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study 1991 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
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