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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
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UA library record |
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Shapiro, S.M.; Yang, B.X.; Noda, Y.; Tanner, L.E.; Schryvers, D. |
Neutron-scattering and electron microscopy studies of premartensitic phenomena in NixAl100-x alloys |
1991 |
Physical review : B : condensed matter and materials physics |
44 |
123 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; de Saegher, B.; van Landuyt, J. |
Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al |
1991 |
Materials research bulletin |
26 |
11 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study |
1991 |
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UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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