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Author
Title
Year
Publication
Volume
Times cited
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Béché, A.
;
Rouviere, J.L.
;
Barnes, J.P.
;
Cooper, D.
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
2013
Ultramicroscopy
131
73
UA library record
;
WoS full record
;
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