NANOlab Center of Excellence literature database -- Query Results

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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	van den Broek, W.; Van Aert, S.; van Dyck, D.	Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency	2012	Microscopy and microanalysis	18	15	UA library record; WoS full record; WoS citing articles
	van den Broek, W.; Van Aert, S.; van Dyck, D.	A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy	2010	Ultramicroscopy	110	16	UA library record; WoS full record; WoS citing articles
	van den Broek, W.; Van Aert, S.; van Dyck, D.	A model based atomic resolution tomographic algorithm	2009	Ultramicroscopy	109	17	UA library record; WoS full record; WoS citing articles

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