Nano Home

NANOlab Center of Excellence literature database

Home |  Show All |  Simple Search |  Advanced Search
Quick Search:
1–2 of 2 records found matching your query (RSS):
toggle visibility
Search within Results:
Display Options:
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
  Author Title Year (down) Publication Volume Times cited Additional Links Links
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Influence of sample thickness, excitation energy and geometry on particle size effects in XRF 1985 X-ray spectrometry 14 UA library record; WoS full record; WoS citing articles doi
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal 1980 X-ray spectrometry 9 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility
Save Citations:
Export Records:
Home CQL Search  |  Library Search  |  Show Record  |  Extract Citations Help