| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Markowicz, A.A.; Van Grieken, R.E. |
Quantification in XRF analysis of intermediate-thickness samples |
2002 |
|
|
|
UA library record |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1990 |
Analytical chemistry |
62 |
|
UA library record |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1988 |
Analytical chemistry |
60 |
|
UA library record |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1986 |
Analytical chemistry |
58 |
|
UA library record |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
Atomic number correction in electron probe X-ray microanalysis of curved samples and particles |
1984 |
Analytical chemistry |
56 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis |
1984 |
Analytical chemistry |
56 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1984 |
Reviews in analytical chemistry |
56 |
|
UA library record |
|
