Nano Home

NANOlab Center of Excellence literature database

Home |  Show All |  Simple Search |  Advanced Search
Quick Search:
1–4 of 4 records found matching your query (RSS):
toggle visibility
Search within Results:
Display Options:
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
  Author Title Year (down) Publication Volume Times cited Additional Links Links
Gijbels, R. The many faces of TOF-SIMS for the characterization of solid (sub)surfaces 2003 UA library record
Gijbels, R. Development of a Fourier transform laser microprobe mass spectrometer with external ion source 1993 ICR/Ion trap newsletter 30 UA library record
Gijbels, R. Oppervlakte en in-diepte analyse via SIMS, SNMS en GDMS 1992 Physicalia magazine 14 UA library record
Gijbels, R. Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals 1991 Acta technica Belgica: metallurgie 30 UA library record
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility
Save Citations:
Export Records:
Home CQL Search  |  Library Search  |  Show Record  |  Extract Citations Help