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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate 1996 Applied surface science 102 9 UA library record; WoS full record; WoS citing articles doi
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Structural characterisation of erbium silicide thin films of an Si(111) substrate 1996 Journal of alloys and compounds 234 14 UA library record; WoS full record; WoS citing articles pdf doi
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