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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Delville, R.; Malard, B.; Pilch, J.; Sittner, P.; Schryvers, D. |
Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
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Delville, R.; Malard, B.; Pilch, J.; Sittner, P.; Schryvers, D. |
Transmission electron microscopy investigation of dislocation slip during superelastic cycling of NiTi wires |
2011 |
International journal of plasticity |
27 |
157 |
UA library record; WoS full record; WoS citing articles |
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