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Ab initio spectroscopy and thermochemistry of the BN molecule”. Martin JML, François JP, Gijbels R, Zeitschrift für Physik : D : atoms, molecules and clusters 21, 47 (1991)
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Accurate ab initio quartic force fields and thermochemistry of FNO and CINO”. Martin JML, François JP, Gijbels R, The journal of physical chemistry 98, 11394 (1994). http://doi.org/10.1021/j100095a022
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L'analyse des eaux géothermales par spectrométrie de masse à, étincelles”. Vandelannoote R, Blommaert W, van Grieken R, Gijbels R, Spectra 2000: la revue de l'instrumentation 53, 66 (1979)
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Analysis of geothermal waters by spark source mass spectrometry”. Vandelannoote R, Blommaert W, Gijbels R, van Grieken R, Fresenius' Zeitschrift für analytische Chemie 309, 291 (1981). http://doi.org/10.1007/BF00488604
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Analysis of thermal waters by ICP-MS”. Veldeman E, Van 't dack L, Gijbels R, Campbell M, Vanhaecke F, Vanhoe H, Vandecasteele C The Royal Society of Chemistry, Cambridge, page 25 (1991).
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Gijbels R, van Grieken R (1977) Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees). S.l
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Gijbels R, van Grieken R, Blommaert W, Van 't dack L, van Espen P, Nullens H, Saelens R (1983) Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges). S.l
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Application of neural networks in image analysis: the classification of geometrical shapes”. Geuens I, Nys B, Gijbels R, Jacob W, CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10, 61 (1993)
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Application of trace element analysis to geothermal waters”. Gijbels R, van Grieken R, Blommaert W, Vandelannoote R, Van 't dack L, , 429 (1977)
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Atomic imaging of cage like structures of silicon”. Nistor L, Van Tendeloo G, Amelinckx S, Cros C, Physica status solidi: A: applied research 146, 119 (1994). http://doi.org/10.1002/pssa.2211460111
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Atomic mass spectrometry”. Gijbels R, Oksenoid KG Academic Press, London, page 2839 (1995).
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Atomic resolution of interfaces in ceramic-superconductors”. Van Tendeloo G, Krekels T, Amelinckx S, Hervieu M, Raveau B, Greaves C, , 35 (1995)
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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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Cation and anion disorder in HbBa2Can-1CunO2n+2+\delta”. Marezio M, Alexandre ET, Bordet P, Capponi J-J, Chaillout C, Kopnin EM, Loureiro SM, Radaelli PG, Van Tendeloo G, Journal of superconductivity 8 (1995)
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Cation ordering in Tl- and Hg-based superconducting materials”. Van Tendeloo G, De Meulenaere P, Hervieu M, Letouze F, Martin C, (1996)
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Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy”. Yasuda K, Hisatsune K, Udoh K, Tanaka Y, Van Tendeloo G, van Landuyt J, Dentistry in Japan 29, 91 (1992)
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Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 4, 1 (1995)
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Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 3, 1 (1994)
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Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, (1991)
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Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis”. Oleshko V, Gijbels R, Jacob W, Lakiere F, van Daele A, Silaev E, Kaplun L, Microscopy, microanalysis, microstructures 6, 79 (1995). http://doi.org/10.1051/mmm:1995108
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Charged-impurity correlations in a δ-doped quantum barrier”. Koenraad PM, Shi JM, van de Stadt AFW, Smets A, Perenboom JAAJ, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Charged-impurity correlations in Si ?-doped GaAs”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals”. Gijbels R, Acta technica Belgica: metallurgie 30, 91 (1991)
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The chemical characterization of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 251 (1993)
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The chirality of carbon nanotubules determined by dark-field electron microscopy”. Bernaerts D, op de Beeck M, Amelinckx S, van Landuyt J, Van Tendeloo G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 74, 723 (1996). http://doi.org/10.1080/01418619608243538
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Combined characterization of nanostructures by AEM and STM”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Mikrochimica acta: supplementum 13, 435 (1996)
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Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques”. Oleshko VP, Gijbels R, Jacob W, , 46 (1996)
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Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders”. Jenett H, Grallath E, Riedel R, Strecker K, Gijbels R, Kennis P, Fres J. Anal. Chem. 341, 265 (1991)
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Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M Editions de physique, Les Ulis, page 701 (1994).
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Comportement hydrogéochimique des éléments traces au cours de l'interaction eau –, roche en milieu alcalin”. Pentcheva EN, Petrov PS, Veldeman E, Van 't dack L, Gijbels R, Doklady Bolgarskoi Akademii Nauk 43, 51 (1990)
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