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	“Elemental trace analysis of small samples by proton-induced X-ray-emission”. Johansson TB, Van Grieken RE, Nelson JW, Winchester JW, Analytical chemistry 47, 855 (1975). http://doi.org/10.1021/AC60356A035 Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) DOI: 10.1021/AC60356A035 Additional Links: UA library record; WoS full record; WoS citing articles Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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