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PXRF, \mu-XRF, vacuum \mu-XRF, and EPMA analysis of Email Champlevé, objects present in Belgian museums”. van der Linden V, Meesdom E, Devos A, van Dooren R, Nieuwdorp H, Janssen E, Balace S, Vekemans B, Vincze L, Janssens K, Microscopy and microanalysis 17, 674 (2011). http://doi.org/10.1017/S1431927611011950
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