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“Doubling the critical temperature of La1.9Sr0.1CuO4 using epitaxial strain”. Loquet J-P, Perret J, Fompeyrine J, Mächler E, Seo JW, Van Tendeloo G, Nature 394, 453 (1998). http://doi.org/10.1038/28810
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 40.137
Times cited: 404
DOI: 10.1038/28810
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“Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain”. Seo JW, Perret J, Fompeyrine J, Loquet J-P, Van Tendeloo G, Electron microscopy: vol. 2 , 287 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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