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“Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC00211A001
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“X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC00163A002
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“X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC00296A019
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“Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC00278A036
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“Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC00276A016
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“X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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