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Author Hofer, C.; Mustonen, K.; Skakalova, V.; Pennycook, T.J.
Title Picometer-precision few-tilt ptychotomography of 2D materials Type A1 Journal article
Year (down) 2023 Publication 2D materials Abbreviated Journal
Volume 10 Issue 3 Pages 035029-7
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract From ripples to defects, edges and grain boundaries, the 3D atomic structure of 2D materials is critical to their properties. However the damage inflicted by conventional 3D analysis precludes its use with fragile 2D materials, particularly for the analysis of local defects. Here we dramatically increase the potential for precise local 3D atomic structure analysis of 2D materials, with both greatly improved dose efficiency and sensitivity to light elements. We demonstrate light atoms can now be located in complex 2D materials with picometer precision at doses 30 times lower than previously possible. Moreover we demonstrate this using WS2, in which the light atoms are practically invisible to conventional methods at low doses. The key advance is combining the concept of few tilt tomography with highly dose efficient ptychography in scanning transmission electron microscopy. We further demonstrate the method experimentally with the even more challenging and newly discovered 2D CuI, leveraging a new extremely high temporal resolution camera.
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Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 001013151600001 Publication Date 2023-06-12
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 2053-1583 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 5.5 Times cited Open Access OpenAccess
Notes Approved Most recent IF: 5.5; 2023 IF: 6.937
Call Number UA @ admin @ c:irua:197809 Serial 8915
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