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| Record | |||||
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| Author | Johansson, T.B.; Van Grieken, R.E.; Nelson, J.W.; Winchester, J.W. | ||||
| Title | Elemental trace analysis of small samples by proton-induced X-ray-emission | Type | A1 Journal article | ||
Year  |
1975 | Publication | Analytical chemistry | Abbreviated Journal | |
| Volume | 47 | Issue | 6 | Pages | 855-860 |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | A1975AA02900016 | Publication Date | 2005-03-08 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0003-2700; 5206-882x | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:113638 | Serial | 7895 | ||
| Permanent link to this record | |||||