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| Author | van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. | ||||
| Title | Do you believe that atoms stay in place when you observe them in HREM? | Type | A1 Journal article | ||
Year  |
2015 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 68 | Issue | 68 | Pages | 158-163 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Recent advancements in aberration-corrected electron microscopy allow for an evaluation of unexpectedly large atom displacements beyond a resolution limit of similar to 0.5 angstrom, which are found to be dose-rate dependent in high resolution images. In this paper we outline a consistent description of the electron scattering process, which explains these unexpected phenomena. Our approach links thermal diffuse scattering to electron beam-induced object excitation and relaxation processes, which strongly contribute to the image formation process. The effect can provide an explanation for the well-known contrast mismatch (“Stobbs factor”) between image calculations and experiments. (C) 2014 Elsevier Ltd. All rights reserved. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000348016500023 | Publication Date | 2014-09-16 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.98 | Times cited | 11 | Open Access | |
| Notes | Approved | Most recent IF: 1.98; 2015 IF: 1.988 | |||
| Call Number | c:irua:123802 | Serial | 745 | ||
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