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| Record | |||||
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| Author | Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. | ||||
| Title | DART explained: how to carry out a discrete tomography reconstruction | Type | P1 Proceeding | ||
Year  |
2008 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 295-296 | ||
| Keywords | P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Springer | Place of Publication | Berlin | Editor | |
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 978-3-540-85154-7 | ISBN | Additional Links | UA library record | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:77914 | Serial | 606 | ||
| Permanent link to this record | |||||