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| Author | van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. | ||||
| Title | Correction of non-linear thickness effects in HAADF STEM electron tomography | Type | A1 Journal article | ||
Year  |
2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 116 | Issue | Pages | 8-12 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In materials science, high angle annular dark field scanning transmission electron microscopy is often used for tomography at the nanometer scale. In this work, it is shown that a thickness dependent, non-linear damping of the recorded intensities occurs. This results in an underestimated intensity in the interior of reconstructions of homogeneous particles, which is known as the cupping artifact. In this paper, this non-linear effect is demonstrated in experimental images taken under common conditions and is reproduced with a numerical simulation. Furthermore, an analytical derivation shows that these non-linearities can be inverted if the imaging is done quantitatively, thus preventing cupping in the reconstruction. | ||||
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| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000304473700002 | Publication Date | 2012-03-09 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 67 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | ||
| Call Number | UA @ lucian @ c:irua:96558 | Serial | 518 | ||
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