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| Record | |||||
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| Author | Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. | ||||
| Title | Computational aspects in quantitative EELS | Type | A1 Journal article | ||
Year  |
2010 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 16 | Issue | S:2 | Pages | 240-241 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2010-08-26 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor | 1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2010 IF: 3.259 | |||
| Call Number | UA @ lucian @ c:irua:96556UA @ admin @ c:irua:96556 | Serial | 454 | ||
| Permanent link to this record | |||||