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| Record | |||||
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| Author | Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. | ||||
| Title | Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM | Type | A1 Journal article | ||
Year  |
2014 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 20 | Issue | S3 | Pages | 126-127 |
| Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2014-08-27 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276 | ISBN | Additional Links | UA library record | |
| Impact Factor | 1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2014 IF: 1.877 | |||
| Call Number | UA @ lucian @ c:irua:136445 | Serial | 4500 | ||
| Permanent link to this record | |||||