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| Record | |||||
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| Author | Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. | ||||
| Title | Ultra-high resolution electron tomography for materials science : a roadmap | Type | A1 Journal article | ||
Year  |
2011 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 17 | Issue | S:2 | Pages | 934-935 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2011-10-07 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor | 1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2011 IF: 3.007 | |||
| Call Number | UA @ lucian @ c:irua:96554 | Serial | 3792 | ||
| Permanent link to this record | |||||