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| Author | Lujan, G.S.; Magnus, W.; Sorée, B.; Ragnarsson, L.A.; Trojman, L.; Kubicek, S.; De Gendt, S.; Heyns, A.; De Meyer, K. | ||||
| Title | Barrier permeation effects on the inversion layer subband structure and its applications to the electron mobility | Type | A1 Journal article | ||
Year  |
2005 | Publication | Microelectronic engineering | Abbreviated Journal | Microelectron Eng |
| Volume | 80 | Issue | Pages | 82-85 | |
| Keywords | A1 Journal article; Engineering sciences. Technology; Condensed Matter Theory (CMT) | ||||
| Abstract | The electron wave functions in the inversion layer are analyzed in the case where the dielectric barriers are not infinite. This forces the electron concentration closer to the interface silicon/oxide and reduces the subband energy. This treatment of the inversion layer is extended to the calculation of the electron mobility degradation due to remote Coulomb scattering on a high-k dielectric stacked transistor. The subband energy reduction leads to a decrease of the scattering charge needed to explain the experimental results. This model can also fit better the experimental data when compared with the case where no barrier permeation is considered. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000231517000021 | Publication Date | 2005-06-05 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0167-9317; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.806 | Times cited | 1 | Open Access | |
| Notes | Approved | Most recent IF: 1.806; 2005 IF: 1.347 | |||
| Call Number | UA @ lucian @ c:irua:102729 | Serial | 222 | ||
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