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| Author | Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. | ||||
| Title | Measurement of specimen thickness by phase change determination in TEM | Type | A1 Journal article | ||
Year  |
2008 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 108 | Issue | 12 | Pages | 1616-1622 |
| Keywords | A1 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000260808300016 | Publication Date | 2008-06-23 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 2 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2008 IF: 2.629 | |||
| Call Number | UA @ lucian @ c:irua:75643 | Serial | 1961 | ||
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