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| Record | |||||
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| Author | Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. | ||||
| Title | Imaging TOF-SIMS for the surface analysis of silver halide microcrystals | Type | A1 Journal article | ||
Year  |
2003 | Publication | Applied surface science | Abbreviated Journal | Appl Surf Sci |
| Volume | 203/204 | Issue | Pages | 614-619 | |
| Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000180527300138 | Publication Date | 2002-12-30 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0169-4332; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 3.387 | Times cited | 7 | Open Access | |
| Notes | Approved | Most recent IF: 3.387; 2003 IF: 1.284 | |||
| Call Number | UA @ lucian @ c:irua:51974 | Serial | 1556 | ||
| Permanent link to this record | |||||