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| Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
| Title | Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency | Type | A1 Journal article | ||
Year  |
2012 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 18 | Issue | 2 | Pages | 336-342 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000302084700011 | Publication Date | 2012-02-14 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.891 | Times cited | 15 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 1.891; 2012 IF: 2.495 | ||
| Call Number | UA @ lucian @ c:irua:96557 | Serial | 1297 | ||
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