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Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) 2001 Fresenius' journal of analytical chemistry 370 3 UA library record; WoS full record; WoS citing articles doi
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