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“Investigation of individual particles and gaseous air pollutants in showcases”. Godoi RHM, Kontozova V, Godoi AFL, Van Grieken R page 147 (2004).
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“Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry”. Szalóki I, Ro C-U, Osán J, de Hoog J, Van Grieken R page 569 (2004).
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“Synchrotron radiation for microscopic X-ray fluorescence analysis”. Adams F, Vincze L, Vekemans B page 343 (2004).
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“Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
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“The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations”. Fredrickx P, Wouters J, Schryvers D Archetype, London, page 137 (2003).
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“Electron diffraction and microscopy of single-walled carbon nanotube bundles”. Colomer J-F, Van Tendeloo G Kluwer, Boston, Mass., page 45 (2003).
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“Glow discharges in emission and mass spectrometry”. Jakubowski N, Bogaerts A, Hoffmann V Blackwell, Sheffield (2003).
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“Numerical modelling of analytical glow discharges”. Bogaerts A, Gijbels R Wiley, Chichester, page 155 (2003).
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“Methods 4: elemental analysis (AAS/AES/X-ray fluorescence)”. Janssens K (2003).
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“X-ray fluorescence analysis”. Janssens K (2003).
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“Study of microgeometry of porous materials using synchrotron computed microtomography”. Jones KW, Feng H, Lindquist WB, Adler PM, Thover JF, Vekemans B, Vincze L, Szalóki I, Van Grieken R, Adams F, Riekel C page 39 (2003).
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“The crystal structure of YSr2Cu3O6+x determined by HREM”. Lebedev O, Van Tendeloo G, Marezio M, Licci F, Gilioli E, Gauzzi A, Prodi A s.l., page 877 (2002).
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“Modeling network for argon glow discharge plasmas with copper cathode”. Bogaerts A, Gijbels R Nova, New York, page 1 (2002).
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“Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film”. Lebedev O, Verbeeck J, Van Tendeloo G, Shapoval O, Belenchuk A, Moshnyaga V, Damaschke B, Samwer K s.l., page 1013 (2002).
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“On the distinction between 16th and 17th century Venetian glass and façon-de-Venise glass”. de Raedt I, Janssens K, Veeckman J page 95 (2002).
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“Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis”. Ro C-U, Hoornaert S, Van Grieken R page 17 (2002).
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“Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
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“Sample preparation for X-ray fluorescence”. Schmeling M, Van Grieken RE page 933 (2002).
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“Photographic materials”. Verlinden G, Gijbels R, Geuens I Surface Spectra IM, Chichester, page 727 (2001).
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“Analytical methods to study atmospheric pollution and weathering of materials”. Van Grieken R, Cardell C, Delalieux F, Eyckmans K page 163 (2001).
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“Luchtkwaliteit boven de Noordzeekust”. Eyckmans K, Van Grieken R page 9 (2001).
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“X-ray fluorescence”. Injuk J, Van Grieken RE page 151 (2001).
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“Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
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“Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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“Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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“Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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“Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
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“Glow discharge mass spectrometry, methods”. Bogaerts A Academic Press, San Diego, Calif., page 669 (2000).
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“Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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“Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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