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Comparison between direct current and radiofrequency glow discharge mass spectrometry for the analysis of oxide-based samples”. de Gendt S, Van Grieken R, Hang W, Harrison WW, Journal of analytical atomic spectrometry 10, 689 (1995). http://doi.org/10.1039/JA9951000689
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Quantitative analysis of iron-rich and other oxide-based samples by means of glow discharge mass spectrometry”. de Gendt S, Schelles W, Van Grieken R, Müller V, Journal of analytical atomic spectrometry 10, 681 (1995). http://doi.org/10.1039/JA9951000681
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Atmospheric concentrations and deposition of heavy metals over the North Sea: a literature review”. Injuk J, Van Grieken R, Journal of atmospheric chemistry 20, 179 (1995). http://doi.org/10.1007/BF00696557
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Cation and anion disorder in HbBa2Can-1CunO2n+2+\delta”. Marezio M, Alexandre ET, Bordet P, Capponi J-J, Chaillout C, Kopnin EM, Loureiro SM, Radaelli PG, Van Tendeloo G, Journal of superconductivity 8 (1995)
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Physico-chemical fate of chromium compounds in the lung sheep model”. Perrault G, Dufresne A, Strati G, McNeil M, Michaud D, Baril M, Bégin R, Labbé, J, Larivière P, Eeckhaoudt S, Van Grieken R, Journal of toxicology and environmental health 44, 247 (1995). http://doi.org/10.1080/15287399509531958
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Electron-electron scattering induced capture in GaAs quantum wells”. Kálna K, Mo×ko M, Peeters FM, Lithuanian journal of physics 35, 435 (1995)
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Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope”. Vanhellemont J, Romano-Rodriguez A, Fedina L, van Landuyt J, Aseev A, Materials science and technology 11, 1194 (1995)
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Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 4, 1 (1995)
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Microanalytical study of the aluminum distribution in bullhead (Ictalurus nebulosus gills”. Eeckhaoudt S, Jacob W, Van Grieken R, Landsberg J, Watt F, Witters H, Microbeam analysis 4, 103 (1995)
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Parameters influencing focussing capabilities of capillary optics”. Vincze L, Janssens K, Adams F, Larsson S, Rindby A, Engstrom P, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 161 (1995)
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Quantitative mu-XRF analysis of heterogeneous samples”. Vincze L, Janssens K, Adams F, Jones K, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 175 (1995)
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Assessment of local analysis by Fourier transform laser microprobe mass spectrometry with external ion source”. van Roy W, Struyf H, Kennis P, Van Vaeck L, Van Grieken R, Andrle C, Microchimica acta 120, 121 (1995). http://doi.org/10.1007/BF01244426
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Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis”. Oleshko V, Gijbels R, Jacob W, Lakiere F, van Daele A, Silaev E, Kaplun L, Microscopy, microanalysis, microstructures 6, 79 (1995). http://doi.org/10.1051/mmm:1995108
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A chemical investigation of altered jade art objects”. Aerts A, Janssens K, Adams F, Orientations , 79 (1995)
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Electron microscopy study of coiled carbon tubules”. Bernaerts D, Zhang XB, Zhang XF, Amelinckx S, Van Tendeloo G, van Landuyt J, Ivanov V, Nagy JB, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 71, 605 (1995). http://doi.org/10.1080/01418619508244470
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A transmission electron microscopy study of tweed-like structures in Al62Cu17.5CO17.5Si3 decagonal quasicrystals”. Zhang Z, Geng W, van Landuyt J, Van Tendeloo G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 71, 1177 (1995)
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In-situ HVEM study of dislocation generation in patterned stress fields at silicon surfaces”. Vanhellemont J, Claeys C, van Landuyt J, Physica status solidi: A: applied research 150, 497 (1995). http://doi.org/10.1002/pssa.2211500144
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Modification of the multislice method for calculating coherent STEM images”. Chen JH, van Dyck D, op de Beeck M, Broeckx J, van Landuyt J, Physica status solidi: A: applied research 150, 13 (1995). http://doi.org/10.1002/pssa.2211500103
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Stability of the superconducting vortex structure around a magnetic dot”. Marmorkos IK, Matulis A, Peeters FM, Physics of low-dimensional structures 10/11, 77 (1995)
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FT-IR characterization of tin dioxide gas sensor materials under working conditions”. Lenaerts S, Roggen J, Maes G, Spectrochimica acta: part A: molecular and biomolecular spectroscopy 51, 883 (1995). http://doi.org/10.1016/0584-8539(94)01216-4
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Recent advances in the analysis of individual environmental particles: a review”. Jambers W, de Bock L, Van Grieken R, The analyst 120, 681 (1995). http://doi.org/10.1039/AN9952000681
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The elemental chemistry of sediments in the Nainital lake, Kumaun Himalaya, India”. Das BK, Singh M, Van Grieken R, The science of the total environment 168, 85 (1995). http://doi.org/10.1016/0048-9697(95)04242-S
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Suspended matter in run-off water from limestone exposure setups”. Vleugels G, Van Grieken R, The science of the total environment 170, 125 (1995). http://doi.org/10.1016/0048-9697(95)04611-4
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Weathering of Leinster granite under ambient atmospheric conditions”. Sweevers E, Peeters A, Van Grieken R, The science of the total environment 167, 73 (1995). http://doi.org/10.1016/0048-9697(95)04571-H
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High-resolution electron microscopy and electron energy-loss spectroscopy of giant palladium clusters”. Oleshko V, Volkov V, Gijbels R, Jacob W, Vargaftik M, Moiseev I, Van Tendeloo G, Zeitschrift für Physik : D : atoms, molecules and clusters 34, 283 (1995). http://doi.org/10.1007/BF01437574
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Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M Editions de physique, Les Ulis, page 701 (1994).
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Electron microscopic study of long period ordering in complex oxides”. Amelinckx S, Nistor LC, Van Tendeloo G s.l., page 1 (1994).
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Electron microscopy of fullerenes and fullerene related structures”. Van Tendeloo G, van Landuyt J, Amelinckx S, , 498 (1994)
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A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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High-resolution electron microscopy for semiconducting materials science”. van Landuyt J, Vanhellemont J Elsevier, Amsterdam, page 1109 (1994).
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