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“The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials”. Kempenaers L, Vincze L, Janssens K, Spectrochimica acta: part B : atomic spectroscopy 55, 651 (2000). http://doi.org/10.1016/S0584-8547(00)00207-X
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