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	“Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992) Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) Additional Links: UA library record Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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