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	“Accurate measurements of atomic displacements in La_0.9Sr_0.1MnO₃ thin films grown on a SrTiO₃ substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000). Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab Additional Links: UA library record Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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