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	“Measuring the absolute position of EELS ionisation edges in a TEM”. Potapov PL, Schryvers D, Ultramicroscopy 99, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 2.843 Times cited: 29 DOI: 10.1016/S0304-3991(03)00185-2 Additional Links: UA library record; WoS full record; WoS citing articles Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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