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Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA)”. Schryvers D, Tirry W, Cao S, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 229 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.229
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FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti”. Cao S, Nishida M, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 1284 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.1284
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Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis”. Delville R, Shi H, James RD, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 105 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.105
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Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 682 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.682
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Optimization of the amount of catalyst and reaction time in single wall nanotube production”. Horvath ZE, Biro LP, Van Tendeloo G, Tondeur C, Bister G, Pierard N, Fonseca A, Nagy JB, Diffusion and defect data : solid state data : part B : solid state phenomena 94, 271 (2003)
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