toggle visibility
Search within Results:
Display Options:
Number of records found: 4

Select All    Deselect All
 | 
Citations
 | 
   print
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces”. Gijbels R, , 101 (2003)
toggle visibility
Development of a Fourier transform laser microprobe mass spectrometer with external ion source”. Gijbels R, ICR/Ion trap newsletter 30 (1993)
toggle visibility
Oppervlakte en in-diepte analyse via SIMS, SNMS en GDMS”. Gijbels R, Physicalia magazine 14, 49 (1992)
toggle visibility
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals”. Gijbels R, Acta technica Belgica: metallurgie 30, 91 (1991)
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: