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Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 682 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.682
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Transmission electron microscopy investigation of dislocation slip during superelastic cycling of NiTi wires”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, International journal of plasticity 27, 282 (2011). http://doi.org/10.1016/j.ijplas.2010.05.005
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